Tungsten copper sheet properties refer to phase analysis, micro-structure observation
and other properties detection. The phase analysis can be specifically divided
into DTA (Differential Thermal Analysis), XRD phase analysis (X-ray
Diffraction), component test and so on. DTA uses differential thermal analyzer,
the principle is to compare by not undergo any chemical reactions and physical
changes at a certain temperature stable substance as a reference with an equal
amount of measured (tungsten copper sheet) in the same environment under
constant variable temperature conditions. Any physical and chemical changes on
the measured and it is located in the same environment as compared to the
standard temperature will be a temporary increase or decrease. The XRD phase
analysis uses copper K radiation target, adjust current, voltage, and scanning
rate, the measured characteristic X lines of tungsten copper sheet specimen
major constituent phases.
For tungsten copper material, component test usually
uses dilute nitric acid - hydrofluoric acid solution, which due to W will
precipitate in nitric acid medium in the form of acid and separated from the Cu.
Next ammonium hydroxide precipitate was dissolved tungstate, ammonium tungstate
determination of tungsten burning gravimetric method; then inductively coupled
plasma atomic emission spectrometry filtrate the residual tungsten, both of
which add up to the total amount of tungsten. The process of micro-structure of
tungsten copper sheet detecting is Sandpaper milling →
Washing → Polishing (Al2O3) →
Washing → Alcohol Cleaning → Drying → Detecting Sample.
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